Optical Measurement of Surface Topography

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and bi...

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Détails bibliographiques
Cote:Libro Electrónico
Collectivité auteur: SpringerLink (Online service)
Autres auteurs: Leach, Richard (Éditeur intellectuel)
Format: Électronique eBook
Langue:Inglés
Publié: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011.
Édition:1st ed. 2011.
Sujets:
Materials-Analysis.
Telecommunication.
Measurement.
Measuring instruments.
Surfaces (Technology).
Thin films.
Characterization and Analytical Technique.
Microwaves, RF Engineering and Optical Communications.
Measurement Science and Instrumentation.
Surfaces, Interfaces and Thin Film.
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