Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various mater...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Bhushan, Bharat (Editor)
Format: Electronic eBook
Language:Inglés
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011.
Edition:1st ed. 2011.
Series:NanoScience and Technology,
Subjects:
Nanotechnology.
Materials-Analysis.
Surfaces (Technology).
Thin films.
Microtechnology.
Microelectromechanical systems.
Condensed matter.
Biophysics.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Microsystems and MEMS.
Condensed Matter Physics.
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