Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques /

The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Bhushan, Bharat (Editor ), Fuchs, Harald (Editor ), Tomitori, Masahiko (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Background-Free Apertureless Near-Field Optical Imaging
  • Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes
  • Near Field Probes: From Optical Fibers to Optical Nanoantennas
  • Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging
  • Scanning Probes for the Life Sciences
  • Self-Sensing Cantilever Sensor for Bioscience
  • AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication
  • Cantilever Spring-Constant Calibration in Atomic Force Microscopy
  • Frequency Modulation Atomic Force Microscopy in Liquids
  • Kelvin Probe Force Microscopy: Recent Advances and Applications
  • Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale
  • Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.

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