Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy /

Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Khulbe, K. C. (Autor), Feng, C. Y. (Autor), Matsuura, Takeshi (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Colección:Springer Laboratory, Manuals in Polymer Science,
Temas:
Polymers.
Social sciences.
Humanities.
Chemistry, Technical.
Medicine-Research.
Biology-Research.
Analytical chemistry.
Food science.
Humanities and Social Sciences.
Industrial Chemistry.
Biomedical Research.
Analytical Chemistry.
Food Science.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Synthetic Membranes for Membrane Processes
  • Atomic Force Microscopy
  • Nodular Structure of Polymers in the Membrane
  • Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface
  • Cross-sectional AFM Image
  • Adhesion
  • Membrane Surface Morphology and Membrane Performance.

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