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Transmission Electron Microscopy and Diffractometry of Materials

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Fultz, Brent (Author), Howe, James (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edition:3rd ed. 2008.
Subjects:
Online Access:Texto Completo