Transmission Electron Microscopy and Diffractometry of Materials

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Fultz, Brent (Author), Howe, James (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edition:3rd ed. 2008.
Subjects:
Materials-Analysis.
Surfaces (Technology).
Thin films.
Crystallography.
Condensed matter.
Spectrum analysis.
Engineering.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Crystallography and Scattering Methods.
Condensed Matter Physics.
Spectroscopy.
Technology and Engineering.
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