Transmission Electron Microscopy and Diffractometry of Materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...
Call Number: | Libro Electrónico |
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Main Authors: | , |
Corporate Author: | |
Format: | Electronic eBook |
Language: | Inglés |
Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2008.
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Edition: | 3rd ed. 2008. |
Subjects: | |
Online Access: | Texto Completo |