Applied Scanning Probe Methods VI Characterization /

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspect...

Description complète

Détails bibliographiques
Cote:Libro Electrónico
Collectivité auteur: SpringerLink (Online service)
Autres auteurs: Bhushan, Bharat (Éditeur intellectuel), Kawata, Satoshi (Éditeur intellectuel)
Format: Électronique eBook
Langue:Inglés
Publié: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2007.
Édition:1st ed. 2007.
Collection:NanoScience and Technology,
Sujets:
Microtechnology.
Microelectromechanical systems.
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Physical chemistry.
Condensed matter.
Microsystems and MEMS.
Surfaces, Interfaces and Thin Film.
Physical Chemistry.
Condensed Matter Physics.
Accès en ligne:Texto Completo
Table des matières:
  • Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices
  • Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules
  • STM Studies on Molecular Assembly at Solid/Liquid Interfaces
  • Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope
  • Atomic Force Microscopy of DNA Structure and Interactions
  • Direct Detection of Ligand-Protein Interaction Using AFM
  • Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments
  • Noncontact Atomic Force Microscopy
  • Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations
  • Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy.

Documents similaires