Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques /

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspect...

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Détails bibliographiques
Cote:Libro Electrónico
Collectivité auteur: SpringerLink (Online service)
Autres auteurs: Bhushan, Bharat (Éditeur intellectuel), Fuchs, Harald (Éditeur intellectuel), Kawata, Satoshi (Éditeur intellectuel)
Format: Électronique eBook
Langue:Inglés
Publié: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2007.
Édition:1st ed. 2007.
Collection:NanoScience and Technology,
Sujets:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
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