SpringerLink (Online service), Yeung, D., Kwok, J. T., Fred, A., Roli, F., & de Ridder, D. (2006). Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings (1st ed. 2006.). Springer Berlin Heidelberg : Imprint: Springer.
Chicago Style (17th ed.) CitationSpringerLink (Online service), Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, and Dick de Ridder. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. 1st ed. 2006. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2006.
MLA (8th ed.) CitationSpringerLink (Online service), et al. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. 1st ed. 2006. Springer Berlin Heidelberg : Imprint: Springer, 2006.