Cita APA (7a ed.)

Borja, J. P., Lu, T., & Plawsky, J. (2016). Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (1st ed. 2016.). Springer International Publishing : Imprint: Springer.

Cita Chicago Style (17a ed.)

Borja, Juan Pablo, Toh-Ming Lu, y Joel Plawsky. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. 1st ed. 2016. Cham: Springer International Publishing : Imprint: Springer, 2016.

Cita MLA (8a ed.)

Borja, Juan Pablo, et al. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. 1st ed. 2016. Springer International Publishing : Imprint: Springer, 2016.