Metrology and Physical Mechanisms in New Generation Ionic Devices

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Celano, Umberto (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edition:1st ed. 2016.
Series:Springer Theses, Recognizing Outstanding Ph.D. Research,
Subjects:
Spectrum analysis.
Microtechnology.
Microelectromechanical systems.
Materials-Analysis.
Spectroscopy.
Microsystems and MEMS.
Characterization and Analytical Technique.
Online Access:Texto Completo
Description
Summary:The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .
Physical Description:XXIV, 175 p. 96 illus., 18 illus. in color. online resource.
ISBN:9783319395319
ISSN:2190-5061

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