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Soft Error Mechanisms, Modeling and Mitigation

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes...

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Détails bibliographiques
Cote:Libro Electrónico
Auteur principal: Sayil, Selahattin (Auteur)
Collectivité auteur: SpringerLink (Online service)
Format: Électronique eBook
Langue:Inglés
Publié: Cham : Springer International Publishing : Imprint: Springer, 2016.
Édition:1st ed. 2016.
Sujets:
Accès en ligne:Texto Completo

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