Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications /

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of smal...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Haschke, Michael (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Colección:Springer Series in Surface Sciences, 55
Temas:
Spectrum analysis.
Surfaces (Technology).
Thin films.
Measurement.
Measuring instruments.
Surfaces (Physics).
Spectroscopy.
Surfaces, Interfaces and Thin Film.
Measurement Science and Instrumentation.
Surface and Interface and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • XRF-Basics
  • Main Components of X-Ray Spectrometers
  • Special Requirements for µ-XRF
  • Quantification
  • Sample Preparation
  • Relations to Other Analytical Methods
  • Applications.

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