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140508s2014 sz | s |||| 0|eng d |
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|a 9783319048642
|9 978-3-319-04864-2
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|a 10.1007/978-3-319-04864-2
|2 doi
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|a Haschke, Michael.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
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|a Laboratory Micro-X-Ray Fluorescence Spectroscopy
|h [electronic resource] :
|b Instrumentation and Applications /
|c by Michael Haschke.
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|a 1st ed. 2014.
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|a Cham :
|b Springer International Publishing :
|b Imprint: Springer,
|c 2014.
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|a XVIII, 356 p. 254 illus., 107 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
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|a online resource
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|a text file
|b PDF
|2 rda
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|a Springer Series in Surface Sciences,
|x 2198-4743 ;
|v 55
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|a XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications.
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|a Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.
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|a Spectrum analysis.
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|a Surfaces (Technology).
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|a Thin films.
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|a Measurement.
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|a Measuring instruments.
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|a Surfaces (Physics).
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|a Spectroscopy.
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|a Surfaces, Interfaces and Thin Film.
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|a Measurement Science and Instrumentation.
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|a Surface and Interface and Thin Film.
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|a SpringerLink (Online service)
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|t Springer Nature eBook
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|i Printed edition:
|z 9783319048659
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|i Printed edition:
|z 9783319048635
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|i Printed edition:
|z 9783319353029
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830 |
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|a Springer Series in Surface Sciences,
|x 2198-4743 ;
|v 55
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|u https://doi.uam.elogim.com/10.1007/978-3-319-04864-2
|z Texto Completo
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|a ZDB-2-PHA
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|a ZDB-2-SXP
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|a Physics and Astronomy (SpringerNature-11651)
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|a Physics and Astronomy (R0) (SpringerNature-43715)
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