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Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications /

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of smal...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Haschke, Michael (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Colección:Springer Series in Surface Sciences, 55
Temas:
Acceso en línea:Texto Completo

MARC

LEADER 00000nam a22000005i 4500
001 978-3-319-04864-2
003 DE-He213
005 20220123031309.0
007 cr nn 008mamaa
008 140508s2014 sz | s |||| 0|eng d
020 |a 9783319048642  |9 978-3-319-04864-2 
024 7 |a 10.1007/978-3-319-04864-2  |2 doi 
050 4 |a QD95-96 
072 7 |a PNFS  |2 bicssc 
072 7 |a SCI078000  |2 bisacsh 
072 7 |a PNFS  |2 thema 
082 0 4 |a 543  |2 23 
100 1 |a Haschke, Michael.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Laboratory Micro-X-Ray Fluorescence Spectroscopy  |h [electronic resource] :  |b Instrumentation and Applications /  |c by Michael Haschke. 
250 |a 1st ed. 2014. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2014. 
300 |a XVIII, 356 p. 254 illus., 107 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Springer Series in Surface Sciences,  |x 2198-4743 ;  |v 55 
505 0 |a XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications. 
520 |a Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions. 
650 0 |a Spectrum analysis. 
650 0 |a Surfaces (Technology). 
650 0 |a Thin films. 
650 0 |a Measurement. 
650 0 |a Measuring instruments. 
650 0 |a Surfaces (Physics). 
650 1 4 |a Spectroscopy. 
650 2 4 |a Surfaces, Interfaces and Thin Film. 
650 2 4 |a Measurement Science and Instrumentation. 
650 2 4 |a Surface and Interface and Thin Film. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9783319048659 
776 0 8 |i Printed edition:  |z 9783319048635 
776 0 8 |i Printed edition:  |z 9783319353029 
830 0 |a Springer Series in Surface Sciences,  |x 2198-4743 ;  |v 55 
856 4 0 |u https://doi.uam.elogim.com/10.1007/978-3-319-04864-2  |z Texto Completo 
912 |a ZDB-2-PHA 
912 |a ZDB-2-SXP 
950 |a Physics and Astronomy (SpringerNature-11651) 
950 |a Physics and Astronomy (R0) (SpringerNature-43715)