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Practical Materials Characterization
This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...
| Clasificación: | Libro Electrónico |
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| Autor Corporativo: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2014.
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| Edición: | 1st ed. 2014. |
| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- 1. X-Ray Diffraction and Reflectivity
- 2. Introduction to Optical Characterization of Materials
- 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES)
- 4. Secondary Ion Mass Spectrometry
- 5. Transmission Electron Microscopy.