Practical Materials Characterization
This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...
Call Number: | Libro Electrónico |
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Corporate Author: | |
Other Authors: | |
Format: | Electronic eBook |
Language: | Inglés |
Published: |
New York, NY :
Springer New York : Imprint: Springer,
2014.
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Edition: | 1st ed. 2014. |
Subjects: | |
Online Access: | Texto Completo |