Bias Temperature Instability for Devices and Circuits

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability.  Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, ano...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Grasser, Tibor (Editor)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer New York : Imprint: Springer, 2014.
Edition:1st ed. 2014.
Subjects:
Electronic circuits.
Semiconductors.
Electronics.
Security systems.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Security Science and Technology.
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Internet

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