Atom Probe Microscopy

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Gault, Baptiste (Author), Moody, Michael P. (Author), Cairney, Julie M. (Author), Ringer, Simon P. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer New York : Imprint: Springer, 2012.
Edition:1st ed. 2012.
Series:Springer Series in Materials Science, 160
Subjects:
Materials-Analysis.
Nanoscience.
Nanochemistry.
Spectrum analysis.
Nanotechnology.
Characterization and Analytical Technique.
Nanophysics.
Spectroscopy.
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