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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design o...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
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| Edición: | 1st ed. 2012. |
| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Fundamentals of Statistical Analysis
- Statistical Full-Chip Leakage Power Analysis
- Statistical Full-Chip Dynamic Power Analysis
- Statistical Parasitic Extraction
- Statistical Compact Modeling and Reduction of Interconnects
- Statistical Analysis of Global Interconnects
- Statistical Analysis and Modeling for Analog and Mixed-Signal Circuits.