Cita APA (7a ed.)

Shen, R., Tan, S. X., & Yu, H. (2012). Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs (1st ed. 2012.). Springer New York : Imprint: Springer.

Cita Chicago Style (17a ed.)

Shen, Ruijing, Sheldon X.-D Tan, y Hao Yu. Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs. 1st ed. 2012. New York, NY: Springer New York : Imprint: Springer, 2012.

Cita MLA (8a ed.)

Shen, Ruijing, et al. Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs. 1st ed. 2012. Springer New York : Imprint: Springer, 2012.