Scanning Transmission Electron Microscopy Imaging and Analysis /

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analys...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Pennycook, Stephen J. (Editor), Nellist, Peter D. (Editor)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer New York : Imprint: Springer, 2011.
Edition:1st ed. 2011.
Subjects:
Optical materials.
Materials-Analysis.
Biophysics.
Condensed matter.
Nanotechnology.
Optical Materials.
Characterization and Analytical Technique.
Bioanalysis and Bioimaging.
Condensed Matter Physics.
Online Access:Texto Completo
Table of Contents:
  • Electron Optics and Aberration Correction
  • Fundamentals of Scattering Theory
  • Image formation in STEM
  • Electron energy loss spectroscopy
  • Energy dispersive x-ray analysis
  • STEM of complex oxides
  • STEM of complex alloys
  • STEM of catalysts
  • STEM of semiconductor devices
  • STEM of ceramic materials
  • STEM of quasicrystals
  • STEM of nanomaterials
  • 3D STEM: tomography
  • 3D STEM: depth slicing
  • Nanobeam diffraction.

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