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Process Variations and Probabilistic Integrated Circuit Design
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality,...
| Call Number: | Libro Electrónico |
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| Corporate Author: | |
| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
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| Edition: | 1st ed. 2012. |
| Subjects: | |
| Online Access: | Texto Completo |