Extreme Statistics in Nanoscale Memory Design

Extreme Statistics in Nanoscale Memory Design brings together some of the world's leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Singhee, Amith (Editor), Rutenbar, Rob A. (Editor)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer US : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Series:Integrated Circuits and Systems,
Subjects:
Electronic circuits.
Electronics.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Online Access:Texto Completo
Table of Contents:
  • Extreme Statistics in Memories
  • Statistical Nano CMOS Variability and Its Impact on SRAM
  • Importance Sampling-Based Estimation: Applications to Memory Design
  • Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
  • Yield Estimation by Computing Probabilistic Hypervolumes
  • Most Probable Point-Based Methods
  • Extreme Value Theory: Application to Memory Statistics.

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