Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures /

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Stanisavljević, Miloš (Author), Schmid, Alexandre (Author), Leblebici, Yusuf (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer New York : Imprint: Springer, 2011.
Edition:1st ed. 2011.
Subjects:
Electronic circuits.
Security systems.
Computer-aided engineering.
Electronic Circuits and Systems.
Security Science and Technology.
Computer-Aided Engineering (CAD, CAE) and Design.
Online Access:Texto Completo
Table of Contents:
  • Introduction
  • Reliability, Faults and Fault Models
  • Nanotechnology and Nanodevices
  • Fault-Tolerant Architectures and Approaches
  • Reliability Evaluation Techniques
  • Averaging Design Implementations
  • Statistical Evaluation of Fault-Tolerance Using Proability Density Functions
  • System Level Reliability Evaluation and Optimization
  • Summary and Conclusions
  • References.

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