Tan, C. M., Li, W., Gan, Z., & Hou, Y. (2011). Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (1st ed. 2011.). Springer London : Imprint: Springer.
Cita Chicago Style (17a ed.)Tan, Cher Ming, Wei Li, Zhenghao Gan, y Yuejin Hou. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections. 1st ed. 2011. London: Springer London : Imprint: Springer, 2011.
Cita MLA (8a ed.)Tan, Cher Ming, et al. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections. 1st ed. 2011. Springer London : Imprint: Springer, 2011.
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