Transmission Electron Microscopy A Textbook for Materials Science /

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This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Williams, David B. (Author), Carter, C. Barry (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer US : Imprint: Springer, 2009.
Edition:2nd ed. 2009.
Subjects:
Materials-Analysis.
Nanotechnology.
Condensed matter.
Spectrum analysis.
Mechanics, Applied.
Solids.
Characterization and Analytical Technique.
Condensed Matter Physics.
Spectroscopy.
Solid Mechanics.
Online Access:Texto Completo
Table of Contents:
  • Basics
  • The Transmission Electron Microscope
  • Scattering and Diffraction
  • Elastic Scattering
  • Inelastic Scattering and Beam Damage
  • Electron Sources
  • Lenses, Apertures, and Resolution
  • How to 'See' Electrons
  • Pumps and Holders
  • The Instrument
  • Specimen Preparation
  • Diffraction
  • Diffraction in TEM
  • Thinking in Reciprocal Space
  • Diffracted Beams
  • Bloch Waves
  • Dispersion Surfaces
  • Diffraction from Crystals
  • Diffraction from Small Volumes
  • Obtaining and Indexing Parallel-Beam Diffraction Patterns
  • Kikuchi Diffraction
  • Obtaining CBED Patterns
  • Using Convergent-Beam Techniques
  • Imaging
  • Amplitude Contrast
  • Phase-Contrast Images
  • Thickness and Bending Effects
  • Planar Defects
  • Imaging Strain Fields
  • Weak-Beam Dark-Field Microscopy
  • High-Resolution TEM
  • Other Imaging Techniques
  • Image Simulation
  • Processing and Quantifying Images
  • Spectrometry
  • X-ray Spectrometry
  • X-ray Spectra and Images
  • Qualitative X-ray Analysis and Imaging
  • Quantitative X-ray Analysis
  • Spatial Resolution and Minimum Detection
  • Electron Energy-Loss Spectrometers and Filters
  • Low-Loss and No-Loss Spectra and Images
  • High Energy-Loss Spectra and Images
  • Fine Structure and Finer Details.

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