Cita APA (7a ed.)

Ahmed, N. (2008). Nanometer Technology Designs: High-Quality Delay Tests (1st ed. 2008.). Springer US : Imprint: Springer.

Cita Chicago Style (17a ed.)

Ahmed, Nisar. Nanometer Technology Designs: High-Quality Delay Tests. 1st ed. 2008. New York, NY: Springer US : Imprint: Springer, 2008.

Cita MLA (8a ed.)

Ahmed, Nisar. Nanometer Technology Designs: High-Quality Delay Tests. 1st ed. 2008. Springer US : Imprint: Springer, 2008.