Cita APA (7a ed.)

Aliev, T. (2007). Digital Noise Monitoring of Defect Origin (1st ed. 2007.). Springer US : Imprint: Springer.

Cita Chicago Style (17a ed.)

Aliev, Telman. Digital Noise Monitoring of Defect Origin. 1st ed. 2007. New York, NY: Springer US : Imprint: Springer, 2007.

Cita MLA (8a ed.)

Aliev, Telman. Digital Noise Monitoring of Defect Origin. 1st ed. 2007. Springer US : Imprint: Springer, 2007.