Design for Manufacturability and Statistical Design A Constructive Approach /

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of th...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Orshansky, Michael (Autor), Nassif, Sani (Autor), Boning, Duane (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Colección:Integrated Circuits and Systems,
Temas:
Electronic circuits.
Computer-aided engineering.
Industrial engineering.
Production engineering.
Electrical engineering.
Electronic Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Industrial and Production Engineering.
Electrical and Electronic Engineering.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Sources of Variability
  • Front End Variability
  • Back End Variability
  • Environmental Variability
  • Variability Characterization and Analysis
  • Test Structures For Variability
  • Statistical Foundations Of Data Analysis And Modeling
  • Design Techniques for Systematic Manufacturability Problems
  • Lithography Enhancement Techniques
  • Ensuring Interconnect Planarity
  • Statistical Circuit Design
  • Statistical Circuit Analysis
  • Statistical Static Timing Analysis
  • Leakage Variability And Joint Parametric Yield
  • Parametric Yield Optimization
  • Conclusions.

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