Cargando…
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptabl...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2007.
|
| Edición: | 2nd ed. 2007. |
| Colección: | Frontiers in Electronic Testing ;
34 |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 001 | 978-0-387-46547-0 | ||
| 003 | DE-He213 | ||
| 005 | 20220118204725.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2007 xxu| s |||| 0|eng d | ||
| 020 | |a 9780387465470 |9 978-0-387-46547-0 | ||
| 024 | 7 | |a 10.1007/0-387-46547-2 |2 doi | |
| 050 | 4 | |a TK7867-7867.5 | |
| 072 | 7 | |a TJFC |2 bicssc | |
| 072 | 7 | |a TEC008010 |2 bisacsh | |
| 072 | 7 | |a TJFC |2 thema | |
| 082 | 0 | 4 | |a 621.3815 |2 23 |
| 100 | 1 | |a Sachdev, Manoj. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits |h [electronic resource] / |c by Manoj Sachdev, José Pineda de Gyvez. |
| 250 | |a 2nd ed. 2007. | ||
| 264 | 1 | |a New York, NY : |b Springer US : |b Imprint: Springer, |c 2007. | |
| 300 | |a XXI, 328 p. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 490 | 1 | |a Frontiers in Electronic Testing ; |v 34 | |
| 505 | 0 | |a Functional and Parametric Defect Models -- Digital CMOS Fault Modeling -- Defects in Logic Circuits and their Test Implications -- Testing Defects and Parametric Variations in RAMs -- Defect-Oriented Analog Testing -- Yield Engineering -- Conclusion. | |
| 520 | |a Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts. The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work. | ||
| 650 | 0 | |a Electronic circuits. | |
| 650 | 0 | |a Electrical engineering. | |
| 650 | 0 | |a Engineering design. | |
| 650 | 0 | |a Electronics. | |
| 650 | 1 | 4 | |a Electronic Circuits and Systems. |
| 650 | 2 | 4 | |a Electrical and Electronic Engineering. |
| 650 | 2 | 4 | |a Engineering Design. |
| 650 | 2 | 4 | |a Electronics and Microelectronics, Instrumentation. |
| 700 | 1 | |a Pineda de Gyvez, José. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9780387516530 |
| 776 | 0 | 8 | |i Printed edition: |z 9781441942852 |
| 776 | 0 | 8 | |i Printed edition: |z 9780387465463 |
| 830 | 0 | |a Frontiers in Electronic Testing ; |v 34 | |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/0-387-46547-2 |z Texto Completo |
| 912 | |a ZDB-2-ENG | ||
| 912 | |a ZDB-2-SXE | ||
| 950 | |a Engineering (SpringerNature-11647) | ||
| 950 | |a Engineering (R0) (SpringerNature-43712) | ||