Style de citation APA (7e éd.)

Sachdev, M., & Pineda de Gyvez, J. (2007). Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (2nd ed. 2007.). Springer US : Imprint: Springer.

Style de citation Chicago (17e éd.)

Sachdev, Manoj, et José Pineda de Gyvez. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. 2nd ed. 2007. New York, NY: Springer US : Imprint: Springer, 2007.

Style de citation MLA (8e éd.)

Sachdev, Manoj, et José Pineda de Gyvez. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. 2nd ed. 2007. Springer US : Imprint: Springer, 2007.