Cargando…

Thermal and Power Management of Integrated Circuits

Thermal modeling of high performance circuits and systems is a crucial component for thermal and power management. The VLSI community is currently lacking a methodology to model and estimate junction temperature at any level of design other than low-level (transistor-level) circuits. The accuracy of...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Vassighi, Arman (Autor), Sachdev, Manoj (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:Integrated Circuits and Systems,
Temas:
Acceso en línea:Texto Completo

MARC

LEADER 00000nam a22000005i 4500
001 978-0-387-29749-1
003 DE-He213
005 20220119162050.0
007 cr nn 008mamaa
008 100301s2006 xxu| s |||| 0|eng d
020 |a 9780387297491  |9 978-0-387-29749-1 
024 7 |a 10.1007/0-387-29749-9  |2 doi 
050 4 |a TK7867-7867.5 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
072 7 |a TJFC  |2 thema 
082 0 4 |a 621.3815  |2 23 
100 1 |a Vassighi, Arman.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Thermal and Power Management of Integrated Circuits  |h [electronic resource] /  |c by Arman Vassighi, Manoj Sachdev. 
250 |a 1st ed. 2006. 
264 1 |a New York, NY :  |b Springer US :  |b Imprint: Springer,  |c 2006. 
300 |a X, 182 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Integrated Circuits and Systems,  |x 1558-9420 
505 0 |a Power, Junction Temperature, and Reliability -- Burn-in as a Reliability Screening Test -- Thermal and Electrothermal Modeling -- Thermal Runaway and Thermal Management -- Low Temperature CMOS Operation. 
520 |a Thermal modeling of high performance circuits and systems is a crucial component for thermal and power management. The VLSI community is currently lacking a methodology to model and estimate junction temperature at any level of design other than low-level (transistor-level) circuits. The accuracy of thermal modeling has a substantial effect on the accuracy of thermal-management studies at the architectural level. Without this essential modeling capability, architecture researchers are limited to inaccurate estimation techniques, which are not suitable for thermal management of integrated circuits. In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book. 
650 0 |a Electronic circuits. 
650 0 |a Engineering design. 
650 0 |a Computer-aided engineering. 
650 0 |a Electrical engineering. 
650 1 4 |a Electronic Circuits and Systems. 
650 2 4 |a Engineering Design. 
650 2 4 |a Computer-Aided Engineering (CAD, CAE) and Design. 
650 2 4 |a Electrical and Electronic Engineering. 
700 1 |a Sachdev, Manoj.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9781441938329 
776 0 8 |i Printed edition:  |z 9780387506920 
776 0 8 |i Printed edition:  |z 9780387257624 
830 0 |a Integrated Circuits and Systems,  |x 1558-9420 
856 4 0 |u https://doi.uam.elogim.com/10.1007/0-387-29749-9  |z Texto Completo 
912 |a ZDB-2-ENG 
912 |a ZDB-2-SXE 
950 |a Engineering (SpringerNature-11647) 
950 |a Engineering (R0) (SpringerNature-43712)