Advances in Electronic Testing Challenges and Methodologies /

Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and devel...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Gizopoulos, Dimitris (Editor)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer US : Imprint: Springer, 2006.
Edition:1st ed. 2006.
Series:Frontiers in Electronic Testing ; 27
Subjects:
Electronic circuits.
Engineering design.
Electronics.
Optical materials.
Electrical engineering.
Computers.
Electronic Circuits and Systems.
Engineering Design.
Electronics and Microelectronics, Instrumentation.
Optical Materials.
Electrical and Electronic Engineering.
Hardware Performance and Reliability.
Online Access:Texto Completo
Table of Contents:
  • Defect-Orinted Testing
  • Failure Mechanisms and Testing in Nanometer Technologies
  • Silicon Debug
  • Delay Testing
  • High-Speed Digital Test Interfaces
  • DFT_Oriented,Low-Cost Testers
  • Embedded Cores and System-on-Chip Testing
  • Embedded MemoryTesting
  • Mixed-Signal Testing and DfT
  • RF Testing
  • Loaded Board Testing.

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