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Leakage in Nanometer CMOS Technologies
Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumptio...
| Cote: | Libro Electrónico |
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| Collectivité auteur: | |
| Autres auteurs: | , |
| Format: | Électronique eBook |
| Langue: | Inglés |
| Publié: |
New York, NY :
Springer US : Imprint: Springer,
2006.
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| Édition: | 1st ed. 2006. |
| Collection: | Integrated Circuits and Systems,
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| Sujets: | |
| Accès en ligne: | Texto Completo |