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Leakage in Nanometer CMOS Technologies
Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumptio...
| Call Number: | Libro Electrónico |
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| Corporate Author: | |
| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
New York, NY :
Springer US : Imprint: Springer,
2006.
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| Edition: | 1st ed. 2006. |
| Series: | Integrated Circuits and Systems,
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| Subjects: | |
| Online Access: | Texto Completo |