Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice.

The focused ion beam (FIB) instrument has experienced an intensive period of maturation since its inception. Numerous new techniques and applications have been brought to fruition, and over the past few years, the FIB has gained acceptance as more than just an expensive sample preparation tool. It h...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Giannuzzi, Lucille A. (Editor)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer US : Imprint: Springer, 2005.
Edition:1st ed. 2005.
Subjects:
Condensed matter.
Surfaces (Technology).
Thin films.
Optical materials.
Spectrum analysis.
Condensed Matter Physics.
Surfaces, Interfaces and Thin Film.
Optical Materials.
Spectroscopy.
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