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Xiaoqing Wen

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Xiaoqing Wen from the Kyushu Institute of Technology, Iizuka, Fukuoka, Japan was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to testing of integrated circuits''. Provided by Wikipedia
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  1. 1
    Power-Aware Testing and Test Strategies for Low Power Devices
    Published 2010
    Other Authors:
    Texto Completo
    Electronic eBook
  2. 2
    VLSI test principles and architectures : design for testability /
    Published 2006
    Other Authors:
    Texto completo
    Texto completo
    Electronic eBook
  3. 3
    VLSI test principles and architectures : design for testability /
    Published 2006
    Other Authors:
    Texto completo
    Texto completo
    Electronic eBook
  4. 4
    VLSI test principles and architectures : design for testability /
    Published 2006
    Other Authors:
    Texto completo
    Electronic eBook
  5. 5
    VLSI test principles and architectures : design for testability /
    Published 2006
    Other Authors:
    Texto completo (Requiere registro previo con correo institucional)
    Electronic eBook
  6. 6
    VLSI test principles and architectures : design for testability /
    Published 2006
    Other Authors:
    Texto completo
    Electronic eBook