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  1. 1
    Microelectronics failure analysis : desk reference /
    Published 2019
    “…Electronic Device Failure Analysis Society…”
    Texto completo
    Electronic eBook
  2. 2
    Microelectronics failure analysis : desk reference /
    Published 2019
    “…Electronic Device Failure Analysis Society…”
    Texto completo
    Electronic eBook
  3. 3
    ISTFA 2017 : conference proceedings from the 43rd International Symposium for Testing and Failure Analysis : November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA /
    Published 2017
    Texto completo
    Electronic Conference Proceeding eBook
  4. 4
    ISTFA 2017 : conference proceedings from the 43rd International Symposium for Testing and Failure Analysis : November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA /
    Published 2017
    Texto completo
    Electronic Conference Proceeding eBook
  5. 5
    ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California /
    Published 2011
    Texto completo
    Electronic Conference Proceeding eBook
  6. 6
    Microelectronics failure analysis : desk reference /
    Published 2011
    Texto completo
    Electronic eBook
  7. 7
    ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California /
    Published 2011
    Texto completo
    Electronic Conference Proceeding eBook
  8. 8
    Microelectronics failure analysis : desk reference /
    Published 2011
    Texto completo
    Electronic eBook
  9. 9
    ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California /
    Published 2011
    Texto completo
    Electronic Conference Proceeding eBook
  10. 10
    ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
    Published 2010
    Texto completo
    Electronic Conference Proceeding eBook
  11. 11
    ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
    Published 2010
    Texto completo
    Electronic Conference Proceeding eBook
  12. 12
    ISTFA 2008 : conference proceedings of the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
    Published 2008
    Texto completo
    Electronic Conference Proceeding eBook
  13. 13
    ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
    Published 2007
    Texto completo
    Electronic Conference Proceeding eBook
  14. 14
    ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA /
    Published 2006
    Texto completo
    Electronic Conference Proceeding eBook
  15. 15
    ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
    Published 2005
    Texto completo
    Electronic Conference Proceeding eBook
  16. 16
    Microelectronics failure analysis : desk reference /
    Published 2004
    “…Electronic Device Failure Analysis Society. Desk Reference Committee…”
    Texto completo
    Electronic eBook
  17. 17
    ISTFA 2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
    Published 2003
    Texto completo
    Electronic Conference Proceeding eBook
  18. 18
    Microelectronic failure analysis : desk reference : 2002 supplement /
    Published 2002
    “…Electronic Device Failure Analysis Society…”
    Texto completo
    Electronic eBook
  19. 19
    Microelectronic failure analysis : desk reference : 2001 supplement /
    Published 2001
    “…Electronic Device Failure Analysis Society…”
    Texto completo
    Electronic eBook
  20. 20
    ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
    Published 2001
    Texto completo
    Electronic Conference Proceeding eBook