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Pathways in Theodicy : An Introduction to the Problem of Evil /

Why does God permit senseless suffering? If God is good and all-powerful, why does evil exist? The problem of evil perennially vexes theology, but many theologians have abandoned the project of theodicy, or the theological explanation of evil, as either fruitless or hopeless. Academic studies on the...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Scott, Mark S. M. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Baltimore, Maryland : Project Muse, 2015
Colección:Book collections on Project MUSE.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:Why does God permit senseless suffering? If God is good and all-powerful, why does evil exist? The problem of evil perennially vexes theology, but many theologians have abandoned the project of theodicy, or the theological explanation of evil, as either fruitless or hopeless. Academic studies on theodicy, moreover, typically succumb to theological deficiency and abstraction, often devoid of any concrete connection to Christian life and practice. In Pathways in Theodicy, designed for students and scholars alike, Mark S. M. Scott reinvigorates stalled debates in philosophy and theology through a detailed reassessment of the problem of evil and the task of theodicy and through a careful analysis of the major models and motifs in theodicy. Scott explores the strengths and weaknesses of classic and contemporary perspectives on the problem of evil and invites readers to assess the cogency and relevance of each on their own. Rather than promoting a single perspective, Pathways in Theodicy explores the plurality of options available to treat the problem of evil and the provisional and tentative nature of theodicy, which searches not for final, definitive solutions but for viable ways to move the conversation forward.
Notas:Issued as part of book collections on Project MUSE.
Descripción Física:1 online resource (232 pages).
Bibliografía:Includes bibliographical references (pages 217-224) and index.
ISBN:9781451469806
Acceso:Access restricted to authorized users and institutions.