Fundamentals and application of atomic force microscopy for food research

Detalles Bibliográficos
Clasificación:Libro Electrónico
Formato: Electrónico eBook
Idioma:Inglés
Publicado: [S.l.] : Academic Press, 2022.
Temas:
Food > Analysis.
Atomic force microscopy.
Aliments > Analyse.
Microscopie �a force atomique.
Atomic force microscopy
Food > Analysis
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover
  • Fundamentals and Application of Atomic Force Microscopy for Food Research
  • Copyright Page
  • Contents
  • List of contributors
  • 1 Introduction of AFM for food research
  • 1 An introduction
  • Acknowledgements
  • References
  • 2 Fundamentals of AFM
  • 2 Atomic force microscopy: from theory to application in food science
  • 2.1 History of atomic force microscopy
  • 2.2 Basic principles of atomic force microscopy
  • 2.2.1 Basic components
  • 2.2.2 Working conditions, basic functions, and theory
  • 2.3 Force measurements and nanomanipulation
  • 2.4 New imaging modes
  • 2.5 Measurement items
  • 2.6 Atomic force microscopy integration with other instruments
  • 2.7 Research ways and applications
  • 2.7.1 Research type
  • 2.7.2 Quick overview of applications in food sciences
  • 2.8 Conclusion
  • References
  • 3 Operation procedures of atomic force microscopy for food and biological samples
  • 3.1 Introduction
  • 3.2 Atomic force microscopy requirements for food samples
  • 3.3 Substrates
  • 3.3.1 Mica
  • 3.3.2 Glass
  • 3.3.3 Graphite
  • 3.4 Sample preparation for food samples
  • 3.4.1 Individual biomolecules
  • 3.4.2 Artificially supported lipid layers
  • 3.4.3 Cells
  • 3.4.4 Food powder
  • 3.4.5 Bulk solid sample
  • 3.5 Cantilever selection
  • 3.5.1 Spring constant
  • 3.5.2 Tip geometry
  • 3.5.3 Resonance frequency and quality factor
  • 3.5.4 Tip functionalization
  • 3.6 Common imaging procedure by atomic force microscopy
  • 3.6.1 Power on system
  • 3.6.2 Mount sample
  • 3.6.2.1 Prepare the sample
  • 3.6.2.2 Load the sample
  • 3.6.3 Mount probe
  • 3.6.3.1 Mount the probe holder to the atomic force microscopy head
  • 3.6.4 Enable software
  • 3.6.5 Align laser
  • 3.6.5.1 Align the laser spot on the front end of the cantilever
  • 3.6.5.2 Maximize the laser SUM signal
  • 3.6.6 Adjust photodiode signal
  • 3.6.7 Cantilever tune (tapping mode only)
  • 3.6.8 Set Initial scan parameters
  • 3.6.9 Engage atomic force microscopy probe
  • 3.6.9.1 Manually engage the atomic force microscopy probe
  • 3.6.9.2 Automatically engage the atomic force microscopy probe
  • 3.6.10 Optimize scan parameters
  • 3.6.11 Acquire and save the image
  • 3.6.12 Withdraw atomic force microscopy probe
  • 3.6.13 Unmount atomic force microscopy probe and sample
  • 3.6.14 Shutdown system
  • 3.6.15 Clean workspace
  • 3.7 Common force measurement procedure by atomic force microscopy
  • 3.7.1 Measure deflection sensitivity
  • 3.7.2 Calculate spring constant
  • 3.7.2.1 Thermal tune method
  • 3.7.2.2 Sader method
  • 3.7.3 Force measurement
  • 3.8 Common nanomanipulation procedure by atomic force microscopy
  • 3.9 Data optimization
  • 3.9.1 Real-time optimization
  • 3.9.1.1 Scan size
  • 3.9.1.2 Scan rate
  • 3.9.1.3 Setpoint
  • 3.9.1.4 Integral gain
  • 3.9.1.5 Proportional gain
  • 3.9.2 Offline optimization
  • 3.9.2.1 Planefit
  • 3.9.2.2 Flatten
  • 3.9.2.3 Erase scan line
  • 3.10 Data analysis

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