Computer techniques for image processing in electron microscopy

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: H�ytch, Martin, Hawkes, P. W.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: [Place of publication not identified] : Academic Press, 2020.
Colección:Advances in imaging and electron physics ; v. 214.
Temas:
Image processing > Digital techniques.
Electron microscopy > Technique.
Traitement d'images > Techniques num�eriques.
Microscopie �electronique > Technique.
digital imaging.
Electron microscopy > Technique
Image processing > Digital techniques
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover
  • Computer Techniques for Image Processing in Electron Microscopy
  • Copyright
  • Contents
  • Contributor
  • Foreword
  • Editorial Preface
  • Preface
  • 1 Image formation theory
  • 1.1 Electron optics
  • 1.2 Beam-specimen interaction
  • 1.3 Linear imaging
  • 1.4 Nonlinear imaging
  • 1.5 Image analysis and object reconstruction
  • 1.6 Resolution, contrast, noise, and radiation damage
  • 2 The discrete Fourier transform
  • 2.1 De nition and fundamental properties
  • 2.2 Approximation of integral transforms
  • 2.3 Multidimensional forms
  • 3 Analytic images
  • 3.1 Complex zeros
  • 3.2 Zero ipping
  • 3.3 Periodic images
  • 3.4 Two-dimensional forms
  • 3.5 The one-sided diffraction plane constraint
  • 3.6 Logarithmic Hilbert transforms
  • 3.7 The realizability of the one-sided constraint
  • 3.8 Logarithmic Hilbert transforms in dark- eld conditions
  • 4 The image and diffraction plane problem: uniqueness
  • 4.1 Statement of the problem
  • 4.2 Data constraints and trivial uniqueness failures
  • 4.3 An important failure of uniqueness
  • 4.4 The continuous aperiodic problem
  • 4.5 The periodic and discrete problems
  • 4.6 Summary
  • 5 The image and diffraction plane problem: numerical methods
  • 5.1 Direct methods
  • 5.2 Steepest descent methods
  • 5.3 The iterative transform method
  • 5.A
  • 5.A.1 Derivatives of functions of complex variables
  • 5.A.2 Sum square residue gradient calculation
  • 5.A.3 The image and diffraction plane algorithm
  • 6 The image and diffraction plane problem: computational trials
  • 6.1 Real problems and mathematical models
  • 6.2 The steepest descent method
  • 6.3 The iterative Fourier transform method
  • 6.4 The matrix inversion method
  • 7 Alternative data for the phase determination
  • 7.1 Defocus pairs
  • 7.2 Bright- eld/dark- eld diffraction pattern sets
  • 7.3 Further possible data
  • 7.4 An assessment of phase determination
  • 8 The hardware of digital image handling
  • 8.1 Optical or digital manipulation?
  • 8.2 Digitization and regeneration
  • 8.3 Processors, representation, and storage
  • 9 Basic software for digital image handling
  • 9.1 A processing system
  • 9.2 Input, output, and data selection
  • 9.3 Transformation
  • 9.4 Correlation and lateral alignment
  • 9.5 Alignment in orientation and magni cation
  • 9.6 Averaging repeated structures
  • 9.7 Object reconstruction
  • 10 Improc
  • 10.1 The objectives and environment
  • 10.2 The implementation technique
  • 10.3 The language structure
  • 10.4 Specimen programs
  • 10.5 The Improc macro de nitions
  • 10.6 Recent extensions
  • A10
  • A10.1 Speci cation of Improc statements
  • A10.2 The Improc macro de nitions
  • A10.3 Fortran generated from Improc programs (Section 10.4)
  • From Table 10.4.1
  • From Table 10.4.2
  • From Table 10.4.3
  • From Table 10.4.4
  • References
  • Index
  • Back Cover

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