Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Cho, Yasuo
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Duxford : Woodhead Publishing, 2020.
Colección:Woodhead Publishing series in electronic and optical materials.
Temas:
Materials > Analysis.
Microscopy.
Microscopy
Mat�eriaux > Analyse.
Microscopie.
microscopy.
Materials > Analysis
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover
  • Scanning Nonlinear Dielectric Microscopy
  • Copyright Page
  • Contents
  • Preface
  • 1 Principles of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric materials
  • 1.1 Basic theory
  • 1.1.1 Macroscopic phenomenological definition of linear and nonlinear dielectric constants
  • 1.1.2 Capacitance variation with alternating electric field
  • 1.2 System setup of scanning nonlinear dielectric microscopy
  • 1.3 Theory for nonlinear dielectric imaging
  • 1.3.1 General theorem for capacitance variation under applied electric field
  • 1.3.2 Theoretical calculation for scanning nonlinear dielectric microscopy image
  • 1.4 Higher-order scanning nonlinear dielectric microscopy
  • 1.4.1 Theory
  • 1.4.2 Theoretical one-dimensional image and depth sensitivity of higher-order scanning nonlinear dielectric microscopy
  • References
  • 2 Ferroelectric polarization measurement
  • 2.1 Analysis of distributions of ferroelectric domains on a microscopic scale using scanning nonlinear dielectric microscopy
  • 2.2 Higher-order nonlinear dielectric analyses
  • References
  • 3 Three-dimensional polarization measurement
  • 3.1 Basics of three-dimensional polarization distribution assessment
  • 3.2 Principles of three-dimensional polarization assessment using scanning nonlinear dielectric microscopy
  • 3.3 Lateral assessment by Kelvin force microscopy with electric field correction
  • 3.4 Lateral nanoscale assessment with electric field correction
  • References
  • 4 Ultrahigh-density ferroelectric data storage using scanning nonlinear dielectric microscopy
  • 4.1 Ferroelectric probe memory based on scanning nonlinear dielectric microscopy with a linear scanning stage
  • 4.1.1 Scanning nonlinear dielectric microscopy with a linear scanning stage for ultrahigh-density ferroelectric data storage
  • 4.1.2 Analysis of nanodomain dots in congruent single-crystal LiTaO3
  • 4.1.3 Manipulating nanodomains using scanning nonlinear dielectric microscopy with a linear scanning stage
  • 4.2 Hard-disk-drive-type scanning nonlinear dielectric microscopy ferroelectric probe memory
  • 4.2.1 Background on development of ultrahigh-density hard-disk-drive-type scanning nonlinear dielectric microscopy ferroele ...
  • 4.2.2 An scanning nonlinear dielectric microscopy ferroelectric data storage system having an hard disk drive format
  • 4.2.3 Ferroelectric recording media for scanning nonlinear dielectric microscopy probe memory having an hard disk drive format
  • 4.2.4 Rapid R/W characteristics of an scanning nonlinear dielectric microscopy data storage system
  • 4.2.5 An hard disk drive scanning nonlinear dielectric microscopy data storage unit for high-density ferroelectric recording

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