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|a 019806793
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|a 1156140815
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|a 0081028032
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|z 9780128172469
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|z 0128172460
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|a (OCoLC)1155316088
|z (OCoLC)1156140815
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|a TA418.5
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|a 620.1/12
|2 23
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|a Cho, Yasuo.
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|a Scanning nonlinear dielectric microscopy :
|b investigation of ferroelectric, dielectric, and semiconductor materials and devices /
|c Yasuo Cho.
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| 260 |
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|a Duxford :
|b Woodhead Publishing,
|c 2020.
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|a 1 online resource
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|a text
|b txt
|2 rdacontent
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|a still image
|b sti
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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1 |
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|a Woodhead Publishing Series in Electronic and Optical Materials
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|a Includes index.
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|a Front Cover -- Scanning Nonlinear Dielectric Microscopy -- Copyright Page -- Contents -- Preface -- 1 Principles of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric materials -- 1.1 Basic theory -- 1.1.1 Macroscopic phenomenological definition of linear and nonlinear dielectric constants -- 1.1.2 Capacitance variation with alternating electric field -- 1.2 System setup of scanning nonlinear dielectric microscopy -- 1.3 Theory for nonlinear dielectric imaging -- 1.3.1 General theorem for capacitance variation under applied electric field
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|a 1.3.2 Theoretical calculation for scanning nonlinear dielectric microscopy image -- 1.4 Higher-order scanning nonlinear dielectric microscopy -- 1.4.1 Theory -- 1.4.2 Theoretical one-dimensional image and depth sensitivity of higher-order scanning nonlinear dielectric microscopy -- References -- 2 Ferroelectric polarization measurement -- 2.1 Analysis of distributions of ferroelectric domains on a microscopic scale using scanning nonlinear dielectric microscopy -- 2.2 Higher-order nonlinear dielectric analyses -- References -- 3 Three-dimensional polarization measurement
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|a 3.1 Basics of three-dimensional polarization distribution assessment -- 3.2 Principles of three-dimensional polarization assessment using scanning nonlinear dielectric microscopy -- 3.3 Lateral assessment by Kelvin force microscopy with electric field correction -- 3.4 Lateral nanoscale assessment with electric field correction -- References -- 4 Ultrahigh-density ferroelectric data storage using scanning nonlinear dielectric microscopy -- 4.1 Ferroelectric probe memory based on scanning nonlinear dielectric microscopy with a linear scanning stage
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|a 4.1.1 Scanning nonlinear dielectric microscopy with a linear scanning stage for ultrahigh-density ferroelectric data storage -- 4.1.2 Analysis of nanodomain dots in congruent single-crystal LiTaO3 -- 4.1.3 Manipulating nanodomains using scanning nonlinear dielectric microscopy with a linear scanning stage -- 4.2 Hard-disk-drive-type scanning nonlinear dielectric microscopy ferroelectric probe memory -- 4.2.1 Background on development of ultrahigh-density hard-disk-drive-type scanning nonlinear dielectric microscopy ferroele ...
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|a 4.2.2 An scanning nonlinear dielectric microscopy ferroelectric data storage system having an hard disk drive format -- 4.2.3 Ferroelectric recording media for scanning nonlinear dielectric microscopy probe memory having an hard disk drive format -- 4.2.4 Rapid R/W characteristics of an scanning nonlinear dielectric microscopy data storage system -- 4.2.5 An hard disk drive scanning nonlinear dielectric microscopy data storage unit for high-density ferroelectric recording
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| 650 |
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|a Materials
|x Analysis.
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|a Microscopy.
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| 650 |
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2 |
|a Microscopy
|0 (DNLM)D008853
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| 650 |
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6 |
|a Mat�eriaux
|x Analyse.
|0 (CaQQLa)201-0297100
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| 650 |
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6 |
|a Microscopie.
|0 (CaQQLa)201-0055735
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| 650 |
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7 |
|a microscopy.
|2 aat
|0 (CStmoGRI)aat300054100
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| 650 |
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7 |
|a Materials
|x Analysis
|2 fast
|0 (OCoLC)fst01011773
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| 650 |
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7 |
|a Microscopy
|2 fast
|0 (OCoLC)fst01020062
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| 776 |
0 |
8 |
|i Print version:
|z 0128172460
|z 9780128172469
|w (OCoLC)1127934545
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| 830 |
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0 |
|a Woodhead Publishing series in electronic and optical materials.
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| 856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780128172469
|z Texto completo
|
