Advanced metrology : freeform surfaces /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Jiang, X. Jane
Otros Autores: Scott, Paul J.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Academic Press, 2020.
Temas:
Metrology.
M�etrologie.
Metrology
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Intro
  • Advanced Metrology: Freeform Surfaces
  • Copyright
  • Contents
  • Preface
  • Acknowledgments
  • Chapter 1: Introduction
  • 1.1. Introduction
  • 1.2. Geometrical variability
  • 1.3. Classification of geometrical surfaces
  • 1.4. Basic classification of geometrical surface modifications
  • 1.5. The ISO system for geometrical products
  • 1.6. A brief history of the specification and metrology of geometrical products
  • 1.7. Remarks
  • References
  • Chapter 2: Fundaments for free-form surfaces
  • 2.1. Introduction
  • 2.2. Free-form surface representation
  • 2.2.1. Free-form surface requirements
  • 2.2.2. Surface representation models
  • 2.2.3. Discrete surface representations
  • 2.2.4. Continuous surface representations
  • 2.2.4.1. Subdivision surfaces
  • 2.2.4.2. Ruled surfaces
  • 2.2.5. Other surfaces methods
  • 2.2.5.1. Skinned surfaces or multisection surfaces
  • 2.2.5.2. Swept surfaces
  • 2.2.5.3. Swung surfaces
  • 2.3. Free-form analysis
  • 2.3.1. Sampling and reconstruction
  • 2.3.1.1. Feature- or attribute-based sampling
  • 2.3.1.2. Sampling based on orthogonal functions
  • 2.3.1.3. Simplification of meshes
  • 2.3.2. Free-form form fitting
  • 2.3.2.1. Nominal form is known
  • 2.3.2.2. Nominal form is not known
  • 2.3.3. Free-form filtration and multiscale decomposition
  • 2.3.3.1. Diffusion filtering
  • 2.3.3.2. Morphological filtering
  • 2.3.3.3. Segmentation
  • 2.3.3.4. Wavelets
  • 2.3.4. Free-form analytics
  • 2.3.4.1. Form parameters
  • 2.3.4.2. Shape parameters
  • 2.3.4.3. Surface texture field parameters
  • 2.3.4.4. Surface texture feature parameters
  • 2.4. Summary
  • References
  • Chapter 3: Free-form surface sampling
  • 3.1. Introduction
  • 3.2. The state of the art
  • 3.2.1. Primitive surfaces
  • 3.2.2. Free-form surfaces
  • 3.2.2.1. Model-adapted sampling strategies
  • 3.2.2.2. Self-adaptive sampling strategies
  • 3.3. Surface reconstruction
  • 3.3.1. Tensor product B-spline reconstruction
  • 3.3.2. Delaunay triangulation reconstruction
  • 3.4. Curvature based sampling
  • 3.4.1. Curve sampling
  • 3.4.2. Surface sampling
  • 3.5. Adaptive sampling strategy
  • 3.5.1. Method description
  • 3.5.1.1. Profile adaptive compression sampling
  • 3.5.1.2. Areal adaptive scanning
  • 3.5.2. Performance validation
  • 3.5.2.1. Experimental settings
  • 3.5.2.2. Results and discussion
  • 3.6. Triangular mesh sampling
  • 3.7. Summary

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