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200414s2020 enk o 001 0 eng d |
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|a YDX
|b eng
|e pn
|c YDX
|d OPELS
|d EBLCP
|d UKAHL
|d OCLCF
|d OCLCQ
|d OCLCO
|d COM
|d OCLCQ
|d OCLCO
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| 020 |
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|a 9780128218167
|q (electronic bk.)
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|a 0128218169
|q (electronic bk.)
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|z 9780128218150
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|z 0128218150
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|z 9780128173237
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|z 0128173238
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|a (OCoLC)1150198565
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|a QC88
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|a 389/.1
|2 23
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|a Jiang, X. Jane.
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|a Advanced metrology :
|b freeform surfaces /
|c X. Jane Jiang, Paul J. Scott.
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| 260 |
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|a London :
|b Academic Press,
|c 2020.
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| 300 |
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|a 1 online resource
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 500 |
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|a Includes index.
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0 |
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|a Intro -- Advanced Metrology: Freeform Surfaces -- Copyright -- Contents -- Preface -- Acknowledgments -- Chapter 1: Introduction -- 1.1. Introduction -- 1.2. Geometrical variability -- 1.3. Classification of geometrical surfaces -- 1.4. Basic classification of geometrical surface modifications -- 1.5. The ISO system for geometrical products -- 1.6. A brief history of the specification and metrology of geometrical products -- 1.7. Remarks -- References -- Chapter 2: Fundaments for free-form surfaces -- 2.1. Introduction -- 2.2. Free-form surface representation
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|a 2.2.1. Free-form surface requirements -- 2.2.2. Surface representation models -- 2.2.3. Discrete surface representations -- 2.2.4. Continuous surface representations -- 2.2.4.1. Subdivision surfaces -- 2.2.4.2. Ruled surfaces -- 2.2.5. Other surfaces methods -- 2.2.5.1. Skinned surfaces or multisection surfaces -- 2.2.5.2. Swept surfaces -- 2.2.5.3. Swung surfaces -- 2.3. Free-form analysis -- 2.3.1. Sampling and reconstruction -- 2.3.1.1. Feature- or attribute-based sampling -- 2.3.1.2. Sampling based on orthogonal functions -- 2.3.1.3. Simplification of meshes -- 2.3.2. Free-form form fitting
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|a 2.3.2.1. Nominal form is known -- 2.3.2.2. Nominal form is not known -- 2.3.3. Free-form filtration and multiscale decomposition -- 2.3.3.1. Diffusion filtering -- 2.3.3.2. Morphological filtering -- 2.3.3.3. Segmentation -- 2.3.3.4. Wavelets -- 2.3.4. Free-form analytics -- 2.3.4.1. Form parameters -- 2.3.4.2. Shape parameters -- 2.3.4.3. Surface texture field parameters -- 2.3.4.4. Surface texture feature parameters -- 2.4. Summary -- References -- Chapter 3: Free-form surface sampling -- 3.1. Introduction -- 3.2. The state of the art -- 3.2.1. Primitive surfaces -- 3.2.2. Free-form surfaces
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|a 3.2.2.1. Model-adapted sampling strategies -- 3.2.2.2. Self-adaptive sampling strategies -- 3.3. Surface reconstruction -- 3.3.1. Tensor product B-spline reconstruction -- 3.3.2. Delaunay triangulation reconstruction -- 3.4. Curvature based sampling -- 3.4.1. Curve sampling -- 3.4.2. Surface sampling -- 3.5. Adaptive sampling strategy -- 3.5.1. Method description -- 3.5.1.1. Profile adaptive compression sampling -- 3.5.1.2. Areal adaptive scanning -- 3.5.2. Performance validation -- 3.5.2.1. Experimental settings -- 3.5.2.2. Results and discussion -- 3.6. Triangular mesh sampling -- 3.7. Summary
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| 650 |
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0 |
|a Metrology.
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| 650 |
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6 |
|a M�etrologie.
|0 (CaQQLa)201-0363317
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| 650 |
|
7 |
|a Metrology
|2 fast
|0 (OCoLC)fst01018841
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| 700 |
1 |
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|a Scott, Paul J.
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| 776 |
0 |
8 |
|i Ebook version :
|z 9780128173244
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| 776 |
0 |
8 |
|i Print version:
|a Jiang, X. Jane.
|t Advanced metrology.
|d London : Academic Press, 2020
|z 0128218150
|z 9780128218150
|w (OCoLC)1127067257
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| 856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780128218150
|z Texto completo
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