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Microscopy methods in nanomaterials characterization.
Annotation
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
[Place of publication not identified] :
Elsevier,
2017.
|
| Colección: | Micro & nano technologies.
Nanomaterials characterization techniques series ; v. 1. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Microscopy methods in nanomaterials characterization. |
| 264 | 1 | |a [Place of publication not identified] : |b Elsevier, |c 2017. | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Micro & nano technologies series | |
| 490 | 1 | |a Nanomaterials characterization techniques series ; |v volume 1 | |
| 505 | 0 | |a Front Cover; Microscopy Methods in Nanomaterials Characterization; Microscopy Methods in Nanomaterials Characterization; Copyright; Contents; List of Contributors; Editor Biographies; 1 -- Scanning Electron Microscopy, ESEM, and X-ray Microanalysis; 1.1 INTRODUCTION; 1.2 SCANNING ELECTRON MICROSCOPY; 1.2.1 Principle; 1.2.2 Vacuum System; 1.2.3 Electron Beam Generation and Electron Optics; 1.2.3.1 Electron Beam Generation; 1.2.4 Signals, Detectors, and Image Formation; 1.2.5 Sample Preparation; 1.2.5.1 Mounting; 1.2.5.2 Fracture Surfaces; 1.2.5.3 Microtomed Sections and Cross Sections | |
| 505 | 8 | |a 1.2.5.4 Target Preparation1.2.5.5 Focused Ion Beam; 1.2.5.6 Drying; 1.2.5.7 Conductive Coating; 1.2.6 Examples; 1.3 ENERGY DISPERSIVE X-RAY MICROANALYSIS; 1.3.1 Signal Generation and Detection; 1.3.2 Examples; 1.4 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; 1.4.1 Principle and Advantages; 1.4.2 Instrumentation; 1.4.3 Examples; 1.5 CRYO SCANNING ELECTRON MICROSCOPY; 1.5.1 Instrumentation; 1.5.2 Examples; 1.6 LOW-VOLTAGE AND HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPY; 1.6.1 Low-Voltage Scanning Electron Microscopy and Inlens Detectors; 1.6.2 Helium Ion Microscopy; REFERENCES | |
| 505 | 8 | |a 2 -- Synthesis of Scanning Electron Microscopy Images of Nanostructures by High-Performance Monte Carlo Modeling2.1 INTRODUCTION; 2.2 MONTE CARLO MODELING OF SECONDARY-ELECTRON EMISSION AT LOW ENERGIES IN DIELECTRICS; 2.2.1 Elastic Scattering Cross Section; 2.2.2 Inelastic Cross Section; 2.2.2.1 Electron-Electron Interactions: Calculation of the Energy-Loss Function; 2.2.2.2 Electron-Phonon Scattering; 2.2.2.3 Polaron Trapping; 2.2.2.4 Quantum-Mechanical Surface Barrier Treatment; 2.2.3 The Monte Carlo Simulation Scheme; 2.2.3.1 Angle After an Elastic Scattering Event | |
| 505 | 8 | |a 2.2.3.2 Angle and Energy Loss After an Electron-Electron Scattering Event2.2.3.3 Angle After an Electron-Phonon Scattering Event; 2.2.3.4 Transmission Through a Barrier; 2.3 EFFICIENT SIMULATION OF COMPLEX THREE-DIMENSIONAL GEOMETRIES; 2.3.1 The Silicon Box; 2.3.1.1 The Silicon Box: Basic Body; 2.3.1.2 The Silicon Box: Unstructured Grid and Voxelization; 2.3.2 Basic Fin Field Effect Transistor Structure; 2.3.3 Three-Dimensional Effects in a PMMA Mask at Nanometer Scale; 2.3.4 Parallel Computing in Sub-10 nm Structures; 2.4 METROLOGY OF NANOSTRUCTURES BY MONTE CARLO MODELING OF SEM IMAGES | |
| 505 | 8 | |a 2.4.1 Metrics for Roughness2.4.2 Critical Dimension Extraction Techniques From SEM Line Scans; 2.4.2.1 Model-Based Library Approach; 2.4.2.2 Contour Technique; 2.4.3 Contact Hole With Line-Edge Roughness; 2.4.3.1 The Simulation Model; 2.4.3.2 CD Extraction by MBLA and by the Edge Contrast; 2.4.4 Polymethyl Methacrylate Patterns With LER; 2.4.4.1 Simulation Model and Parameters; 2.4.4.2 Critical Dimension Extraction by Model-Based Library Approach; 2.4.4.3 LER/LWR Analysis by the Model-Based Library Approach; 2.4.4.4 LER/LWR Analysis From Contour | |
| 520 | 8 | |a Annotation |b Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization techniqueDiscusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniquesPresents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each. | |
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Nanostructures. | |
| 650 | 0 | |a Nanostructured materials. | |
| 650 | 0 | |a Nanotechnology. | |
| 650 | 0 | |a Nanoscience. | |
| 650 | 2 | |a Nanostructures |0 (DNLM)D049329 | |
| 650 | 2 | |a Nanotechnology |0 (DNLM)D036103 | |
| 650 | 6 | |a Nanostructures. |0 (CaQQLa)201-0232666 | |
| 650 | 6 | |a Nanomat�eriaux. |0 (CaQQLa)201-0258061 | |
| 650 | 6 | |a Nanosciences. |0 (CaQQLa)201-0370913 | |
| 650 | 6 | |a Nanotechnologie. |0 (CaQQLa)201-0225435 | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Engineering (General) |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Reference. |2 bisacsh | |
| 650 | 7 | |a Nanoscience |2 fast |0 (OCoLC)fst01032629 | |
| 650 | 7 | |a Nanostructured materials |2 fast |0 (OCoLC)fst01032630 | |
| 650 | 7 | |a Nanostructures |2 fast |0 (OCoLC)fst01032635 | |
| 650 | 7 | |a Nanotechnology |2 fast |0 (OCoLC)fst01032639 | |
| 776 | 0 | 8 | |i Print version: |t Microscopy methods in nanomaterials characterization. |d [Place of publication not identified] : Elsevier, 2017 |z 0323461417 |z 9780323461412 |w (OCoLC)967559492 |
| 830 | 0 | |a Micro & nano technologies. | |
| 830 | 0 | |a Nanomaterials characterization techniques series ; |v v. 1. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780323461412 |z Texto completo |