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170524s2017 ne ob 001 0 eng d |
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|a YDX
|b eng
|e pn
|c YDX
|d N$T
|d IDEBK
|d EBLCP
|d UIU
|d OPELS
|d N$T
|d OCLCF
|d MERER
|d NLE
|d OCLCQ
|d OTZ
|d D6H
|d UAB
|d OCLCQ
|d U3W
|d OCLCQ
|d S2H
|d OCLCO
|d OCLCQ
|d SFB
|d OCLCQ
|d OCLCO
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|a 987910972
|a 988058810
|a 989781871
|a 990319324
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|a 9780323461467
|q (electronic bk.)
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|a 0323461468
|q (electronic bk.)
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|z 9780323461405
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|z 0323461409
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035 |
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|a (OCoLC)987983019
|z (OCoLC)987910972
|z (OCoLC)988058810
|z (OCoLC)989781871
|z (OCoLC)990319324
|
050 |
|
4 |
|a TA418.9.N35
|
072 |
|
7 |
|a TEC
|x 009000
|2 bisacsh
|
072 |
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7 |
|a TEC
|x 035000
|2 bisacsh
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|a 620.1/157
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|a Spectroscopic methods for nanomaterials characterization.
|n Volume 2 /
|c edited by Sabu Thomas [and others].
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|a Amsterdam :
|b Elsevier,
|c 2017.
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|a 1 online resource
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|a text
|b txt
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|a computer
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|a online resource
|b cr
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|a Micro & Nano Technologies Series
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|a Nanomaterials characterization techniques series ;
|v volume 2
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|a Front Cover; Spectroscopic Methods for Nanomaterials Characterization; Spectroscopic Methods for Nanomaterials Characterization; Copyright; Contents; List of Contributors; Editor Biographies; 1 -- Atomic Force Microscopy as a Nanoanalytical Tool; 1.1 INTRODUCTION; 1.2 SPECIMEN PREPARATION; 1.2.1 Thin Films; 1.2.2 Physical and Chemical Etching, Ion Etching; 1.2.3 Ultramicrotomy; 1.3 TYPICAL EXAMPLES OF NANOMATERIALS CHARACTERIZATION BY ATOMIC FORCE MICROSCOPY; 1.3.1 Nanoparticles Imaging and Manipulation; 1.3.2 Biobased Nanomaterials and Nanoencapsulation.
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|a 1.3.3 Comparison With Electron Microscopy1.4 CONCLUDING REMARKS; ACKNOWLEDGMENTS; REFERENCES; 2 -- Electrochemical Characterization; 2.1 INTRODUCTION; 2.2 ELECTROCHEMICAL CELL; 2.3 ELECTROCHEMICAL CHARACTERIZATION; 2.3.1 Voltammetric Techniques; 2.3.1.1 Polarography; 2.3.1.2 Differential Pulse Voltammetry; 2.3.1.3 Hydrodynamic Voltammetry; 2.3.1.4 Stripping Voltammetry; 2.3.1.5 Cyclic Voltammetry; 2.3.1.6 Square-Wave Voltammetry; 2.3.1.7 Staircase Voltammetry; 2.3.2 Electrochemical Impedance Spectroscopy; 2.3.3 Galvanostatic Charge-Discharge; 2.3.4 Chronopotentiometry; 2.3.5 Chronoamperometry.
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|a 2.3.6 Coulometry2.3.7 Chronocoulometry; 2.3.8 Scanning Electrochemical Microscope; 2.4 APPLICATIONS; 2.4.1 Supercapacitors and Batteries; 2.4.2 Sensor Studies; 2.4.3 Coatings; 2.5 SUMMARY; REFERENCES; 3 -- Ultraviolet Spectroscopy: A Facile Approach for the Characterization of Nanomaterials; 3.1 INTRODUCTION; 3.2 SPECTROCHEMICAL METHODS; 3.2.1 Absorption Laws; 3.2.2 Ultraviolet Spectroscopy; 3.3 NANOMATERIALS; 3.3.1 Classification of Nanoparticles; 3.3.1.1 Zero-Dimensional Nanomaterials; 3.3.1.2 One-Dimensional Nanomaterials; 3.3.1.3 Two-Dimensional Nanoparticles.
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|a 3.3.1.4 Three-Dimensional Nanoparticles3.4 CHARACTERIZATION OF NANOPARTICLES; 3.5 ADVANTAGES OF UV SPECTROSCOPY; 3.6 CHARACTERIZATION OF NANOPARTICLES USING UV SPECTROSCOPY; 3.7 CONCLUSIONS; REFERENCES; 4 -- Fourier Transform Infrared Spectroscopy; 4.1 INTRODUCTION; 4.2 WORKING PRINCIPLE; 4.3 SAMPLE ANALYSIS PROCESS; 4.3.1 Instrumentation; 4.3.2 Sample Preparation; 4.3.3 Working of a Fourier Transform Infrared Spectrometer; 4.3.4 Sample Preparation Techniques; 4.3.4.1 Gas Samples; 4.3.4.2 Liquid Samples; 4.3.4.3 Solid Samples; 4.3.5 Alkali Halide Disks; 4.3.6 Mulls.
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|a 4.4 ANALYTICAL INFORMATION FOR FOURIER TRANSFORM INFRARED [2]4.4.1 Qualitative Analysis; 4.4.1.1 Structural Elucidation; 4.4.1.2 Compound Identification; 4.4.2 Quantitative Analysis; 4.5 INTERPRETATION AND ANALYSIS OF THE INFRARED SPECTRUM; 4.6 INTERPRETING SOME FUNCTIONAL GROUPS; 4.6.1 Hydrocarbons; 4.6.2 Aromatic Compounds; 4.6.3 Nitriles and Alkynes; 4.6.4 Alcohols and Amines; 4.6.5 Ethers; 4.6.6 Carbonyl Compounds; 4.6.7 Aldehydes; 4.6.8 Carboxylic Acids; 4.7 SIGNIFICANCE AND DRAWBACK OF FOURIER TRANSFORM INFRARED; 4.7.1 Significance; 4.7.1.1 Speed; 4.7.1.2 Sensitivity; 4.7.1.3 Simplicity.
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|a Includes index.
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|a Includes bibliographical references and index.
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|a Nanostructured materials
|x Spectra.
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|a Nanomat�eriaux
|0 (CaQQLa)201-0258061
|x Spectre.
|0 (CaQQLa)201-0374293
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|a TECHNOLOGY & ENGINEERING
|x Engineering (General)
|2 bisacsh
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|a TECHNOLOGY & ENGINEERING
|x Reference.
|2 bisacsh
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|a Nanostructured materials
|x Spectra
|2 fast
|0 (OCoLC)fst01032634
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700 |
1 |
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|a Thomas, Sabu.
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700 |
1 |
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|a Thomas, Raju.
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1 |
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|a Zachariah, Ajesh K.
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|a Mishra, Raghvendra Kumar.
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|i Print version:
|t Spectroscopic methods for nanomaterials characterization. Volume 2.
|d Amsterdam : Elsevier, 2017
|z 9780323461405
|z 0323461409
|w (OCoLC)967501540
|
856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780323461405
|z Texto completo
|