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Progress in optics. Volume sixty two /
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam :
Elsevier,
2017.
|
| Edición: | First edition. |
| Colección: | Progress in Optics ;
Volume 62 |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Front Cover; Progress in Optics; Copyright; Contents; Contributors; Preface; Chapter One: Modern Aspects of Intensity Interferometry With Classical Light; 1. Introduction; 2. The Hanbury Brown-Twiss Effect With Classical Electromagnetic Beams; 2.1. Background; 2.2. Formulas for Correlations Between Intensity Fluctuations in Stochastic Electromagnetic Beams; 2.3. Properties of the Degree of Cross-Polarization; 2.4. Evolution of Correlations Between Intensity Fluctuations on Propagation; 2.5. Alternative Approach to the Basic Problem; 3. Ghost Imaging and Diffraction With Classical Light.
- 3.1. Background3.2. Methods of Describing Ghost Imaging and Diffraction With Classical Light; 3.3. Ghost Imaging of Pure Phase Objects With Classical Light; 3.4. Selected Applications of Classical Ghost Imaging and Diffraction; 3.4.1. Classical Ghost Imaging Through Turbulence; 3.4.2. Classical Ghost Imaging and Diffraction With X Rays; 3.4.3. Classical Ghost Imaging and Diffraction in the Time Domain; 4. Optical Coherence Tomography Based on Classical Intensity Interferometry; 4.1. Background; 4.2. Incorporating Intensity Interferometry Into Optical Coherence Tomography.
- 4.3. Quantum-Mimetic Intensity-Interferometric Optical Coherence Tomography With Dispersion Cancelation4.3.1. Theory in the Spectral Domain; 4.3.2. A Practical Method of Realization; 4.3.3. Theory in the Time Domain; 5. Concluding Remarks; Acknowledgments; References; Chapter Two: Optical Testing and Interferometry; 1. Wavefront Representation and Its Characteristics; 1.1. Mathematical Wavefront Representations; 1.2. Transverse Aberrations; 1.3. Least Squares Fitting; 1.4. Gram-Schmidt Orthogonalization; 1.5. Zernike Polynomials; 1.6. Aspheric Optical Surface Representation.
- 2. Tests That Measure Wavefront Distortions2.1. Newton Interferometer; 2.2. Fizeau Interferometer; 2.3. Twyman-Green Interferometer; 2.4. Common Path Interferometers; 3. Tests That Measure Transverse Aberrations; 3.1. Foucault or Knife-Edge Test; 3.2. Ronchi Test; 3.3. Hartmann Test; 3.4. Shack-Hartmann and Other Modified Hartmann Tests; 3.5. Lateral Shearing Interferometers; 4. Tests That Measure Curvature; 4.1. Hartmann Test With Four Sampling Points; 4.2. Irradiance Transport Equation; 5. Interferogram Analysis; 5.1. Sparse Sampling of the Fringes; 5.2. Digital Interferometry.
- 5.3. Single Interferogram Analysis With a Spatial Carrier6. Phase Shifting Interferometry; 6.1. Instrumentation; 6.2. Algorithms; 6.2.1. Three Steps Separated 120 Degree; 6.2.2. Four Steps Separated 90 Degree; 6.2.3. Four Steps (3+1) Separated 120 Degree; 6.2.4. Five Steps (4+1) Separated 90 Degree; 7. Testing of Aspherical Surfaces; 7.1. Autocompensating Configurations; 7.2. Compensators to Test Aspherical Surfaces; 7.2.1. Testing Hyperboloids With Autocollimating Configurations; 7.2.2. Synthetic Hologram Compensators; 7.3. Wavefront Stitching; 7.4. Two Wavelengths Measurements; References.