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Reliability, robustness and failure mechanisms of LED devices : methodology and evaluation /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Deshayes, Yannick (Autor), B�echou, Laurent (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Saint Louis : ISTE Press, Ltd. ; Elsevier, 2016.
Colección:Durability, robustness and reliability of photonic devices set.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures.
  • 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover.