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Reliability, robustness and failure mechanisms of LED devices : methodology and evaluation /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Deshayes, Yannick (Autor), B�echou, Laurent (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Saint Louis : ISTE Press, Ltd. ; Elsevier, 2016.
Colección:Durability, robustness and reliability of photonic devices set.
Temas:
Acceso en línea:Texto completo

MARC

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100 1 |a Deshayes, Yannick,  |e author. 
245 1 0 |a Reliability, robustness and failure mechanisms of LED devices :  |b methodology and evaluation /  |c Yannick Deshayes, Laurent B�echou. 
264 1 |a London :  |b ISTE Press, Ltd. ;  |a Saint Louis :  |b Elsevier,  |c 2016. 
300 |a 1 online resource (174 pages) 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Durability, robustness and reliability of photonic devices set 
588 0 |a Online resource; title from PDF title page (EBSCO, viewed March 21, 2017). 
504 |a Includes bibliographical references and index. 
505 0 |a Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures. 
505 8 |a 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover. 
650 0 |a Light emitting diodes. 
650 6 |a Diodes �electroluminescentes.  |0 (CaQQLa)201-0060416 
650 7 |a TECHNOLOGY & ENGINEERING  |x Mechanical.  |2 bisacsh 
650 7 |a Light emitting diodes  |2 fast  |0 (OCoLC)fst00998542 
700 1 |a B�echou, Laurent,  |e author. 
776 0 8 |i Print version:  |a Deshayes, Yannick.  |t Reliability, robustness and failure mechanisms of led devices : methodology and evaluation.  |d London, England ; Oxford, England : ISTE Press ; Elsevier, �2016  |h viii, 160 pages  |z 9781785481529 
830 0 |a Durability, robustness and reliability of photonic devices set. 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9781785481529  |z Texto completo