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SCIDIR_ocn961064714 |
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OCoLC |
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20231120112146.0 |
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m o d |
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cr cnu---unuuu |
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161022s2016 enk ob 001 0 eng d |
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|b eng
|e pn
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|d OPELS
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|d OCLCQ
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|d OCLCO
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|a 960838706
|a 965418024
|a 1235824790
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|a 9780081010884
|q (electronic bk.)
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|a 0081010885
|q (electronic bk.)
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|z 9781785481529
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|z 1785481525
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|a (OCoLC)961064714
|z (OCoLC)960838706
|z (OCoLC)965418024
|z (OCoLC)1235824790
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|a TK7871.89.L53
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|a TEC
|x 009070
|2 bisacsh
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|a 621.381522
|2 23
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|a Deshayes, Yannick,
|e author.
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|a Reliability, robustness and failure mechanisms of LED devices :
|b methodology and evaluation /
|c Yannick Deshayes, Laurent B�echou.
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264 |
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|a London :
|b ISTE Press, Ltd. ;
|a Saint Louis :
|b Elsevier,
|c 2016.
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|a 1 online resource (174 pages)
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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490 |
1 |
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|a Durability, robustness and reliability of photonic devices set
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|a Online resource; title from PDF title page (EBSCO, viewed March 21, 2017).
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|a Includes bibliographical references and index.
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|a Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures.
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|a 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover.
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650 |
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|a Light emitting diodes.
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650 |
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|a Diodes �electroluminescentes.
|0 (CaQQLa)201-0060416
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650 |
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|a TECHNOLOGY & ENGINEERING
|x Mechanical.
|2 bisacsh
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650 |
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7 |
|a Light emitting diodes
|2 fast
|0 (OCoLC)fst00998542
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700 |
1 |
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|a B�echou, Laurent,
|e author.
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776 |
0 |
8 |
|i Print version:
|a Deshayes, Yannick.
|t Reliability, robustness and failure mechanisms of led devices : methodology and evaluation.
|d London, England ; Oxford, England : ISTE Press ; Elsevier, �2016
|h viii, 160 pages
|z 9781785481529
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830 |
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0 |
|a Durability, robustness and reliability of photonic devices set.
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856 |
4 |
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|u https://sciencedirect.uam.elogim.com/science/book/9781785481529
|z Texto completo
|