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Atom probe tomography : put theory into practice /
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London :
Academic Press,
2016.
|
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Front Cover; ATOM PROBE TOMOGRAPHY#; ATOM PROBE TOMOGRAPHY PUT THEORY INTO PRACTICEED; Copyright; CONTENTS; CONTRIBUTORS; PREFACE; LIST OF ABBREVIATIONS; One
- Early Developments and Basic Concepts; Two
- Field Ion Emission Mechanisms; Three
- Basics of Field Ion Microscopy; Four
- Atom Probe Sample Preparation; Five
- Time-of-Flight Mass Spectrometry and Composition Measurements; Six
- Atom Probe Tomography: Detector Issues and Technology; Seven
- Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches; Eight
- Laser-Assisted Field Evaporation.
- Nine
- Data MiningTen
- Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography; Eleven
- Combining Atom Probe Tomography and Optical Spectroscopy; A; B; INDEX; Back Cover; INTRODUCTION; ATOM PROBE TOMOGRAPHY IN MATERIALS SCIENCE TODAY; BASIC CONCEPTS; CONCLUDING REMARKS, THE SPECIFICITIES OF ATOM PROBE TOMOGRAPHY; REFERENCES; INTRODUCTION; FIELD GENERATION AT THE SURFACE OF A FIELD EMITTER; FIELD EMISSION AT THE TIP SURFACE FROM ELECTRON EMISSION TO FIELD EVAPORATION; TRAJECTORIES OF IONS AFTER IONIZATION OR FIELD EVAPORATION IN THE ATOM PROBE.
- Conclusionreferences; introduction; basic principles; field ion microscopy in materials science; conclusion; references; specimen preparation by electropolishing; sample preparation using focused ion beam milling; conclusions; references; introduction; general concepts and definitions; optimizing the mass spectrum in atom probe tomography; extracting information from mass spectra; references; introduction; microchannel plate assembly; conventional delay line detector; conventional measure of timing information; accuracy of conventional delay line detector for single events.
- Coevaporation effectaccuracy of conventional delay line detector for multiple events; advanced delay line detector; influence of detection systems performances on low-angle atom probe accuracy; influence of detection systems on atom probe accuracy in wide-angle ap; effect of multiple events detection on composition; conclusion; references; classical methods of tomographic reconstruction; a few words on metrological performances and terminology; spatial precision; improving spatial accuracy of apt images; conclusions and perspectives; references; introduction.
- Historical background of field evaporation assisted by laser pulsesoptical properties of nano tips; physical mechanisms of field evaporation assisted by laser pulses; consequences on the la-apt performances; conclusions and perspectives; references; preliminary definitions; building the tools; relevance of the approach as a function of the feature of interest; identifying the bias; conclusion; references; motivations for a correlative approach; relevant techniques for a correlative approach; experimental protocols; degradation of specimen due to observation in stem.